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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices
Publication with shared reference
10.1109/aspdac.2006.1594661
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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices
Publication with shared reference
10.1109/aspdac.2006.1594661
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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices
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