A. A. Lazarenko
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
A. A. Lazarenko has a total of 6 co-authors. Here are the top co-authors by number of shared publications:
- Anton Yu. Egorov
ITMO University
3 shared publications E. V. Nikitina
St. Petersburg Academic University, Nanotechnology Research and Education Center,Russian Academy of Sciences,St. Petersburg,Russia
3 shared publications- Evgeniy V. Pirogov
Alferov University, 8/3 Khlopina st., Saint Petersburg 194021, Russian Federation
3 shared publications - Maksim S. Sobolev
Alferov University, 8/3 Khlopina st., St. Petersburg 194021, Russian Federation
3 shared publications D. V. Denisov
Russian Academy of Sciences
1 shared publicationM. A. Kaliteevski
Saint-Petersburg Academic University
1 shared publication
Latest Publications
- 1 March 2016
- Published by Pleiades Publishing Ltd in Technical Physics Letters
- Vol. 42 (3) , 284-286
The influence of an In0.52Al0.48As transition layer design on the transport characteristics of a metamorphic high-electron-mobility transistor
We have used the atomic force microscopy and Hall effect measurements to study the influence of InAlAs transition layer design on the electron mobility in the InAlAs/InGaAs/GaAs channel of a highelectron- mobility transistor (HEMT) with the metamorphic buffer. The optimum buffer layer favors suppression of the misfit dislocation threading into upper layers of the HEMT heterostructure and prevents development of the surface microrelief.
- 1 March 2016
- Published by Pleiades Publishing Ltd in Technical Physics Letters
- Vol. 42 (3) , 284-286
The influence of an In0.52Al0.48As transition layer design on the transport characteristics of a metamorphic high-electron-mobility transistor
We have used the atomic force microscopy and Hall effect measurements to study the influence of InAlAs transition layer design on the electron mobility in the InAlAs/InGaAs/GaAs channel of a highelectron- mobility transistor (HEMT) with the metamorphic buffer. The optimum buffer layer favors suppression of the misfit dislocation threading into upper layers of the HEMT heterostructure and prevents development of the surface microrelief.
- 16 April 2015
- Published by Pleiades Publishing Ltd in Semiconductors
- Vol. 49 (4) , 479-482
Photoluminescence of heterostructures with GaP1 − x N x and GaP1 − x − y N x As y layers grown on GaP and Si substrates by molecular-beam epitaxy
- 16 April 2015
- Published by Pleiades Publishing Ltd in Semiconductors
- Vol. 49 (4) , 479-482
Photoluminescence of heterostructures with GaP1 − x N x and GaP1 − x − y N x As y layers grown on GaP and Si substrates by molecular-beam epitaxy
- 7 March 2014
- Published by Pleiades Publishing Ltd in Semiconductors
- Vol. 48 (3) , 392-396
Molecular beam epitaxy of GaPN, GaPAsN, and InGaPN nitride solid solutions
Experimental samples of semiconductor heterostructures with GaP1−x N x layers and In1−x − y GaP y N x and GaP y N x As1 − x − y quantum wells are synthesized by molecular beam epitaxy on GaP (001) substrates. The structural properties of the samples are investigated by X-ray diffraction and the molar fraction x of nitrogen in the GaP1 − x N x layers is determined. To compare the structural and optical properties of the samples, the photoluminescence of epitaxial GaP1 − x N x layers and heterostructures with InGaPN and GaPAsN quantum wells with GaPN barriers is studied. The photoluminescence and X-ray diffraction data on the GaP1−x N x samples are compared with parameters calculated within the band anticrossing model. Based on the experimental and calculated data, it is concluded that the hybridization parameter is not constant and depends on the molar fraction of nitrogen.
- 7 March 2014
- Published by Pleiades Publishing Ltd in Semiconductors
- Vol. 48 (3) , 392-396
Molecular beam epitaxy of GaPN, GaPAsN, and InGaPN nitride solid solutions
Experimental samples of semiconductor heterostructures with GaP1−x N x layers and In1−x − y GaP y N x and GaP y N x As1 − x − y quantum wells are synthesized by molecular beam epitaxy on GaP (001) substrates. The structural properties of the samples are investigated by X-ray diffraction and the molar fraction x of nitrogen in the GaP1 − x N x layers is determined. To compare the structural and optical properties of the samples, the photoluminescence of epitaxial GaP1 − x N x layers and heterostructures with InGaPN and GaPAsN quantum wells with GaPN barriers is studied. The photoluminescence and X-ray diffraction data on the GaP1−x N x samples are compared with parameters calculated within the band anticrossing model. Based on the experimental and calculated data, it is concluded that the hybridization parameter is not constant and depends on the molar fraction of nitrogen.
- 1 August 2013
- Published by Pleiades Publishing Ltd in Technical Physics Letters
- Vol. 39 (8) , 698-701
Reduced absorption of light by metallic intra-cavity contacts: Tamm plasmon based laser mode engineering
It was widely accepted that embedding of metallic layers into optoelectronic structures is detrimental to lasing due to the absorption in the metal. However, recently macroscopic optical coherence and lasing was observed in microcavities with an intra-cavity single metallic layer. Here we propose the design of the of microcavity-type structure with two or more intra-cavity metallic layers which could serve as contacts for electrical pumping. The design of optical modes based on utilizing peculiarities of Tamm plasmon provides vanishing absorption due to the fixing of the node of the electric field of optical mode to metallic layers. Proposed design can be used for fabrication of vertical cavity lasers with intra-cavity metallic contacts.
- 1 August 2013
- Published by Pleiades Publishing Ltd in Technical Physics Letters
- Vol. 39 (8) , 698-701
Reduced absorption of light by metallic intra-cavity contacts: Tamm plasmon based laser mode engineering
It was widely accepted that embedding of metallic layers into optoelectronic structures is detrimental to lasing due to the absorption in the metal. However, recently macroscopic optical coherence and lasing was observed in microcavities with an intra-cavity single metallic layer. Here we propose the design of the of microcavity-type structure with two or more intra-cavity metallic layers which could serve as contacts for electrical pumping. The design of optical modes based on utilizing peculiarities of Tamm plasmon provides vanishing absorption due to the fixing of the node of the electric field of optical mode to metallic layers. Proposed design can be used for fabrication of vertical cavity lasers with intra-cavity metallic contacts.