B. Wilson
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
B. Wilson has a total of 7 co-authors. Here are the top co-authors by number of shared publications:
- Fabiano Libano
Arizona State University (ASU), Tempe, AZ, USA
2 shared publications - Michael Wirthlin
Brigham Young University
2 shared publications - Paolo Rech
Department of Industrial Engineering, University of Trento, Trento, Italy
2 shared publications - Carlo Cazzaniga
U.K. Research Innovation (UKRI), Science and Technology Facilities Council (STFC)
1 shared publication - Christopher David Frost
ChipIR, Rutherford Appleton Laboratory, Science and Technology Facility Council, Didcot, UK
1 shared publication - J. Anderson1 shared publication
Latest Publications
- 26 March 2020
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 67 (7) , 1478-1484
Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAs
Convolutional neural networks are quickly becoming viable solutions for self-driving vehicles, military, and aerospace applications. At the same time, due to their high level of design flexibility, reprogrammable capability, low powerconsumption, and relatively low cost, Field-Programmable Gate- Arrays (FPGAs) are very good candidates to implement neural networks. Unfortunately, radiation-induced errors are known to be an issue in SRAM-based FPGAs. More specifically, we have seen that particles can change the content of the FPGA’s configuration memory, consequently corrupting the implemented circuit and generating observable errors at the output. Through extensive fault-injection, we determine the reliability impact of applying binary quantization to convolutional layers of neural networks on FPGAs, by analyzing the relationships between model accuracy, resource utilization, performance, error criticality and radiation cross-section. We were able to find that a design with quantized convolutional layers can be 39% less sensitive to radiation, whereas the portion of errors that are considered critical (misclassifications) in the network is increased by 12%. Moreover, we also derive generic equations that consider both accuracy and radiation in order to model the overall failure rate of neural networks.
- 26 March 2020
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 67 (7) , 1478-1484
Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAs
Convolutional neural networks are quickly becoming viable solutions for self-driving vehicles, military, and aerospace applications. At the same time, due to their high level of design flexibility, reprogrammable capability, low powerconsumption, and relatively low cost, Field-Programmable Gate- Arrays (FPGAs) are very good candidates to implement neural networks. Unfortunately, radiation-induced errors are known to be an issue in SRAM-based FPGAs. More specifically, we have seen that particles can change the content of the FPGA’s configuration memory, consequently corrupting the implemented circuit and generating observable errors at the output. Through extensive fault-injection, we determine the reliability impact of applying binary quantization to convolutional layers of neural networks on FPGAs, by analyzing the relationships between model accuracy, resource utilization, performance, error criticality and radiation cross-section. We were able to find that a design with quantized convolutional layers can be 39% less sensitive to radiation, whereas the portion of errors that are considered critical (misclassifications) in the network is increased by 12%. Moreover, we also derive generic equations that consider both accuracy and radiation in order to model the overall failure rate of neural networks.
- 30 November 2018
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 66 (1) , 216-222
Selective Hardening for Neural Networks in FPGAs
- 30 November 2018
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 66 (1) , 216-222
Selective Hardening for Neural Networks in FPGAs