Yongjing Shi
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Research Subjects
Yongjing Shi has a total of 23 co-authors. Here are the top co-authors by number of shared publications:
Siyuan Long
College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China
5 shared publicationsFusheng Pan
4 shared publicationsShicai Yang
3 shared publications- Cheng Li
Scottish Universities Physics Alliance (SUPA), The Institute for Thin Films, Sensors & Imaging, University of the West of Scotland, Paisley PA1 2BE, UK
2 shared publications - Des Gibson
University of the West of Scotland
2 shared publications - Fusheng Pan
College of Materials Science and Engineering, Chongqing University, Chongqing 400044, China
2 shared publications
Latest Publications
- Open Access
Simulation and Optimization of Film Thickness Uniformity in Physical Vapor Deposition
Optimization of thin film uniformity is an important aspect for large-area coatings, particularly for optical coatings where error tolerances can be of the order of nanometers. Physical vapor deposition is a widely used technique for producing thin films. Applications include anti-reflection coatings, photovoltaics etc. This paper reviews the methods and simulations used for improving thin film uniformity in physical vapor deposition (both evaporation and sputtering), covering characteristic aspects of emission from material sources, projection/mask effects on film thickness distribution, as well as geometric and rotational influences from apparatus configurations. Following the review, a new program for modelling and simulating thin film uniformity for physical vapor deposition was developed using MathCAD. Results from the program were then compared with both known theoretical analytical equations of thickness distribution and experimental data, and found to be in good agreement. A mask for optimizing thin film thickness distribution designed using the program was shown to improve thickness uniformity from ±4% to ±0.56%.
Open AccessSimulation and Optimization of Film Thickness Uniformity in Physical Vapor Deposition
Optimization of thin film uniformity is an important aspect for large-area coatings, particularly for optical coatings where error tolerances can be of the order of nanometers. Physical vapor deposition is a widely used technique for producing thin films. Applications include anti-reflection coatings, photovoltaics etc. This paper reviews the methods and simulations used for improving thin film uniformity in physical vapor deposition (both evaporation and sputtering), covering characteristic aspects of emission from material sources, projection/mask effects on film thickness distribution, as well as geometric and rotational influences from apparatus configurations. Following the review, a new program for modelling and simulating thin film uniformity for physical vapor deposition was developed using MathCAD. Results from the program were then compared with both known theoretical analytical equations of thickness distribution and experimental data, and found to be in good agreement. A mask for optimizing thin film thickness distribution designed using the program was shown to improve thickness uniformity from ±4% to ±0.56%.
- Open Access
Investigation of TiO2 Thin Film Deposited by Microwave Plasma Assisted Sputtering and Its Application in 3D Glasses
TiO2 deposition using separate regions for sputtering and oxidation is not well investigated. We optimized process parameter for such as oxygen flow and microwave power to produce high quality TiO2 filters for Stereo/3D imaging applications. This deposition technique was chosen for its unique advantages: high deposition rates while increasing the probability of obtaining stoichiometric oxides, reduces possibility of target poisoning and provides better stability of process. Various characterization methods, such as scanning electron microscopy (SEM), atomic force microscopy (AFM), Raman, X-ray diffraction (XRD), transmission spectroscopy, were used in compliment to simulations for detailed analysis of deposited TiO2 thin films. Process parameters were optimized to achieve TiO2 films with low surface scattering and absorption for fabricating multi-passbands interference filter for 3D glasses. From observations and quantitative analysis of surfaces, it was seen that surface roughness increases while oxygen flow or microwave power increases. As the content of anatase phase also increases with higher microwave power and higher oxygen flow, the formation of anatase grains can cause higher surface roughness. Optical analysis of samples validates these trends and provided additional information for absorption trends. Optimized parameters for deposition process are then obtained and the final fabricated 3D glasses filters showed high match to design, within 0.5% range for thickness error.
Open AccessInvestigation of TiO2 Thin Film Deposited by Microwave Plasma Assisted Sputtering and Its Application in 3D Glasses
TiO2 deposition using separate regions for sputtering and oxidation is not well investigated. We optimized process parameter for such as oxygen flow and microwave power to produce high quality TiO2 filters for Stereo/3D imaging applications. This deposition technique was chosen for its unique advantages: high deposition rates while increasing the probability of obtaining stoichiometric oxides, reduces possibility of target poisoning and provides better stability of process. Various characterization methods, such as scanning electron microscopy (SEM), atomic force microscopy (AFM), Raman, X-ray diffraction (XRD), transmission spectroscopy, were used in compliment to simulations for detailed analysis of deposited TiO2 thin films. Process parameters were optimized to achieve TiO2 films with low surface scattering and absorption for fabricating multi-passbands interference filter for 3D glasses. From observations and quantitative analysis of surfaces, it was seen that surface roughness increases while oxygen flow or microwave power increases. As the content of anatase phase also increases with higher microwave power and higher oxygen flow, the formation of anatase grains can cause higher surface roughness. Optical analysis of samples validates these trends and provided additional information for absorption trends. Optimized parameters for deposition process are then obtained and the final fabricated 3D glasses filters showed high match to design, within 0.5% range for thickness error.
- 1 September 2014
- Published by Elsevier in Transactions of Nonferrous Metals Society of China
- Vol. 24 (9) , 2856-2863
Effect of bias voltage on compositional, mechanical and corrosion property of ZrNbAlN multilayer films by unbalanced magnetron sputtering
- 1 September 2014
- Published by Elsevier in Transactions of Nonferrous Metals Society of China
- Vol. 24 (9) , 2856-2863
Effect of bias voltage on compositional, mechanical and corrosion property of ZrNbAlN multilayer films by unbalanced magnetron sputtering
- 30 January 2013
- Published by Elsevier in Journal of Alloys and Compounds
- Vol. 559, 196-202
Effect of N2 flow rate on structure and property of ZrNbAlNx multilayer films deposited by magnetron sputtering
- 30 January 2013
- Published by Elsevier in Journal of Alloys and Compounds
- Vol. 559, 196-202
Effect of N2 flow rate on structure and property of ZrNbAlNx multilayer films deposited by magnetron sputtering
- 1 April 2009
- Published by Elsevier in Applied Surface Science
- Vol. 255 (13-14) , 6515-6524
Effects of N2 content and thickness on CrNx coatings on Mg alloy by the planar DC reactive magnetron sputtering
- 1 April 2009
- Published by Elsevier in Applied Surface Science
- Vol. 255 (13-14) , 6515-6524
Effects of N2 content and thickness on CrNx coatings on Mg alloy by the planar DC reactive magnetron sputtering
- 1 September 2008
- Published by Elsevier in Applied Surface Science
- Vol. 254 (22) , 7342-7350
Structural and tribological properties of CrTiAlN coatings on Mg alloy by closed-field unbalanced magnetron sputtering ion plating
- 1 September 2008
- Published by Elsevier in Applied Surface Science
- Vol. 254 (22) , 7342-7350
Structural and tribological properties of CrTiAlN coatings on Mg alloy by closed-field unbalanced magnetron sputtering ion plating
- 1 July 2008
- Published by Elsevier in Applied Surface Science
- Vol. 254 (18) , 5861-5867
Effect of nitrogen content on the properties of CrNxOyCz coating prepared by DC reactive magnetron sputtering
- 1 July 2008
- Published by Elsevier in Applied Surface Science
- Vol. 254 (18) , 5861-5867
Effect of nitrogen content on the properties of CrNxOyCz coating prepared by DC reactive magnetron sputtering