BGBo Gao

Bo Gao

*This is an algorithmically generated author record based on publicly available information.

Current Organizations / Institutes

The organizations/institutes from the scholar's latest article


Bo Gao has a total of 8 co-authors. Here are the top co-authors by number of shared publications:


Latest Publications

  • Open Access

    Research on Processing Temperature of Atmospheric Pressure Microwave Plasma Based on Fused Silica Etching

    by Xiang Wu, Bin Fan, Qiang Xin, Dawei Luo, Bo Gao, Wei Li, Zhentian Guan, Qiang Chen

    This study investigates the processing temperature characteristics and etching behavior of fused silica using an atmospheric pressure microwave plasma jet. The temperature distribution within the processing region was measured in real time via infrared thermography. The effects of microwave input power, argon flow rate, and CF4 flow rate on the processing temperature were systematically examined using a single-factor approach. Experimental results reveal a strong positive correlation between the plasma temperature and microwave power. The temperature initially rises and then declines with increasing argon flow, peaking at 3 slm, while it increases and eventually stabilizes with higher CF4 flow. Fixed-point etching demonstrates that the etching rate increases with rising processing temperature. Furthermore, heat accumulation during prolonged dwell time leads to a nonlinear increase in the removal rate. This effect can be effectively mitigated by employing a multi-segment processing strategy, enabling more stable and controllable material removal. The effectiveness of this processing method has also been verified on a fused quartz sub-mirror.

  • Open Access

    Hybrid Inductively Coupled Plasma and Computer-Controlled Optical Surfacing Polishing for Rapid Fabrication of Damage-Free Ultra-Smooth Surfaces

    by Wei Li, Peiqi Jiao, Dawei Luo, Qiang Xin, Bin Fan, Xiang Wu, Bo Gao, Qiang Chen

    The polymer deposition layer (PDL) formed during inductively coupled plasma (ICP) processing significantly limits the figuring accuracy and surface quality of fused silica optics. This study investigates the formation mechanism, composition, and evolution of the PDL under varying dwell times and proposes an innovative dwell time gradient strategy to suppress roughness deterioration. A significant disparity in hardness and elastic modulus between the deposition layer and the substrate is revealed, explaining its preferential removal and protective buffering effect in computer-controlled optical surfacing (CCOS). A hybrid ICP-CCOS polishing process was developed for processing a ϕ100 mm fused silica mirror. The results show that within 33 min, the surface graphic error RMS was significantly reduced from 58.006 nm to 12.111 nm, and within 90 min, the surface roughness was ultra-precisely reduced from Ra 1.719 nm to Ra 0.151 nm. The average processing efficiency was approximately 0.63 cm2/min. Critically, a damage-free, ultra-smooth surface without subsurface damage (SSD) was successfully achieved. This hybrid process enables the simultaneous optimization of figure accuracy and roughness, eliminating the need for iterative figuring cycles. It provides a novel theoretical framework for high-precision figuring and post-ICP polymer removal, advancing the efficient fabrication of high-performance optics.