Interest of silver and gold metallization for molecular SIMS and SIMS imaging

This publication has 15 references indexed in Scilit:

• Secondary ion and laser ablation mass spectrometry for the quantitative characterization of styrene–butadiene copolymers
  Journal of Mass Spectrometry, 2002
• Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition
  Analytical Chemistry, 2002
• Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions
  International Journal of Mass Spectrometry, 1999
• Improvement of signal intensities in static secondary-ion mass spectrometry using halide additives and substrate modification
  Journal of Mass Spectrometry, 1998
• Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1995
• Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces and additives
  Surface and Interface Analysis, 1993
• “In Situ” XPS Investigation of Polymers Metallized by Evaporation
  1992
• Microscope imaging by time-of-flight secondary ion mass spectrometry
  Microscopy Microanalysis Microstructures, 1992
• Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry
  Analytical Chemistry, 1991
• Secondary ion mass spectrometry. Cationization of organic molecules with metals
  Journal of the American Chemical Society, 1978