Integration and High-Temperature Characterization of Ferroelectric Vanadium-Doped Bismuth Titanate Thin Films on Silicon Carbide
Open Access
- 20 March 2017
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 46 (7) , 4478-4484
Abstract
No abstract availableKeywords
Funding Information
- Knut och Alice Wallenbergs Stiftelse
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