Defect filter for alternate RF test
Authors:
- 1 May 2010
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 15301877,p. 265-270
Abstract
Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.Keywords
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