Growth of amorphous-layer-free microcrystalline silicon on insulating glass substrates by plasma-enhanced chemical vapor deposition
Authors:
- 15 September 1997
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 71 (11) , 1534-1536
Abstract
Using a triode plasma-enhanced chemical vapor deposition (PECVD) system and high dilution of (down to a gas flow ratio of ), amorphous-layer-free -Si:H has been successfully grown on insulating glass substrates in the continuous PECVD growth mode. It is demonstrated that an ultrathin layer of such -Si:H can serve as a seed layer to facilitate an epitaxial-like growth of -Si:H (seeded growth).
Keywords
This publication has 10 references indexed in Scilit:
- Substrate dependence of initial growth of microcrystalline silicon in plasma-enhanced chemical vapor depositionJournal of Applied Physics, 1996
- Recent Progress in Microcrystalline Semiconductor Thin FilmsMRS Proceedings, 1996
- Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatmentPhysical Review B, 1995
- Preparation of ultrathin microcrystalline silicon layers by atomic hydrogen etching of amorphous silicon and end-point detection by real time spectroellipsometryApplied Physics Letters, 1994
- Structure of Polycrystalline Silicon Thin Film Fabricated from Fluorinated Precursors by Layer-by-Layer TechniqueJapanese Journal of Applied Physics, 1994
- Bond Selectivity in Silicon Film GrowthScience, 1992
- Electronic properties of amorphous and microcrystalline silicon prepared in a microwave plasma from SiF4Philosophical Magazine Part B, 1991
- Growth of Amorphous, Microcrystalline, and Epitaxial Silicon in Low Temperature Plasma DepositionMRS Proceedings, 1990
- Transition from Amorphous to Crystalline Silicon: Effect of Hydrogen on Film GrowthMRS Proceedings, 1988
- Wide-Rrange Control of Crystallite Size and Its Orientation in Glow-Discharge Deposited µc-Si:HJapanese Journal of Applied Physics, 1983