Ruoru Li
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Ruoru Li has a total of 14 co-authors. Here are the top co-authors by number of shared publications:
- Zijian Xu
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
6 shared publications - Sheng Chen
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
5 shared publications - Xiangzhi Zhang
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, People's Republic of China
5 shared publications - Renzhong Tai
Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, China
4 shared publications - Shuhan Wu
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
3 shared publications - Yingling Zhang
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
3 shared publications
Latest Publications
- Open Access
Sparse-Scan Ptychography with Hybrid-Overlap Scanning and Reference-Guided Probe Updates
Sparse-scan ptychography accelerates data acquisition but compromises the overlap-induced redundancy essential for stable blind reconstruction. In low-overlap cases, object errors are often transferred to the probe update, causing crosstalk and artifacts. In this work, we propose a sparse-scan ptychography method termed hybrid-scan ptychography, which combines a hybrid-overlap scanning strategy with a reference-guided ePIE reconstruction algorithm. In this method, a localized high-overlap scan is used to establish a reliable probe estimate for reconstructing a wide field of view scanned on a low-overlap grid. As a stabilizing prior, this probe estimate is integrated into the ePIE probe update for the low-overlap region through an additional quadratic regularization term, thereby ensuring accurate probe reconstruction for sparse-scan region. This method effectively suppresses sparse-scan artifacts and ensures robust, high-fidelity reconstruction, as demonstrated by numerical simulations and soft X-ray ptychography experiments. With the new method, the acquisition efficiency of ptychography can be increased by at least 2 times without significant resolution reduction.
Open AccessSparse-Scan Ptychography with Hybrid-Overlap Scanning and Reference-Guided Probe Updates
Sparse-scan ptychography accelerates data acquisition but compromises the overlap-induced redundancy essential for stable blind reconstruction. In low-overlap cases, object errors are often transferred to the probe update, causing crosstalk and artifacts. In this work, we propose a sparse-scan ptychography method termed hybrid-scan ptychography, which combines a hybrid-overlap scanning strategy with a reference-guided ePIE reconstruction algorithm. In this method, a localized high-overlap scan is used to establish a reliable probe estimate for reconstructing a wide field of view scanned on a low-overlap grid. As a stabilizing prior, this probe estimate is integrated into the ePIE probe update for the low-overlap region through an additional quadratic regularization term, thereby ensuring accurate probe reconstruction for sparse-scan region. This method effectively suppresses sparse-scan artifacts and ensures robust, high-fidelity reconstruction, as demonstrated by numerical simulations and soft X-ray ptychography experiments. With the new method, the acquisition efficiency of ptychography can be increased by at least 2 times without significant resolution reduction.
- 21 March 2026
- Published by Elsevier in Optics & Laser Technology
- Vol. 200
Adaptive relaxation parameters tuning strategy for ePIE algorithm
- 21 March 2026
- Published by Elsevier in Optics & Laser Technology
- Vol. 200
Adaptive relaxation parameters tuning strategy for ePIE algorithm
- Open Access
Strategies for Suppression and Compensation of Signal Loss in Ptychography
X-ray ptychography is an ultrahigh resolution imaging technique widely used in synchrotron radiation facilities. Its imaging performance relies on the quality of the acquired signals. However, the X-ray detectors used often suffer from signal loss due to sensor gaps, beamstops, defective pixels, overexposure, or other factors, resulting in degraded image quality. To suppress and compensate for the effects of signal loss, we proposed the known probe approach to partially recover the lost signals and introduced the high probe divergence strategy by investigating the effects of probe divergence on reconstruction quality under signal loss conditions. Both simulation and experiment results show that high probe divergence can effectively suppress the impact of signal loss on reconstruction quality while using a known probe as the initial probe for reconstruction can largely recover missing signals in Fourier space, resulting in a much better image than using a guessed initial probe. These strategies allow for high-quality imaging in the presence of signal loss without secondary data acquisition, significantly improving experimental efficiency and reducing radiation damage compared to previous strategies.
Open AccessStrategies for Suppression and Compensation of Signal Loss in Ptychography
X-ray ptychography is an ultrahigh resolution imaging technique widely used in synchrotron radiation facilities. Its imaging performance relies on the quality of the acquired signals. However, the X-ray detectors used often suffer from signal loss due to sensor gaps, beamstops, defective pixels, overexposure, or other factors, resulting in degraded image quality. To suppress and compensate for the effects of signal loss, we proposed the known probe approach to partially recover the lost signals and introduced the high probe divergence strategy by investigating the effects of probe divergence on reconstruction quality under signal loss conditions. Both simulation and experiment results show that high probe divergence can effectively suppress the impact of signal loss on reconstruction quality while using a known probe as the initial probe for reconstruction can largely recover missing signals in Fourier space, resulting in a much better image than using a guessed initial probe. These strategies allow for high-quality imaging in the presence of signal loss without secondary data acquisition, significantly improving experimental efficiency and reducing radiation damage compared to previous strategies.
- Open Access
Dynamic Coherent Diffractive Imaging with Modulus Enforced Probe and Low Spatial Frequency Constraints
Dynamic behavior is prevalent in biological and condensed matter systems at the nano- and mesoscopic scales. Typically, we capture images as “snapshots” to demonstrate the evolution of a system, and coherent X-ray diffraction imaging (CDI), as a lensless imaging technique, provides a nanoscale resolution, allowing us to clearly observe these microscopic phenomena. This paper presents a new dynamic CDI method based on zone-plate optics aiming to overcome the limitations of existing techniques in imaging fast dynamic processes by integrating the spatio-temporal dual constraint with a probe constraint. In this method, the modulus-enforced probe constraint and the temporal correlation of the dynamic sample low-frequency information are exploited and combined with an empty static region constraint in the dynamic sample. Using this method, we achieved a temporal resolution of 20 Hz and a spatial resolution of 13.2 nm, which were verified by visualized experimental results. Further comparisons showed that the reconstructed images were consistent with the ptychography reconstruction results, confirming the accuracy and feasibility of the method. This work is expected to provide a new tool for materials science and mesoscopic life sciences, promoting a deeper understanding of complex dynamic processes.
Open AccessDynamic Coherent Diffractive Imaging with Modulus Enforced Probe and Low Spatial Frequency Constraints
Dynamic behavior is prevalent in biological and condensed matter systems at the nano- and mesoscopic scales. Typically, we capture images as “snapshots” to demonstrate the evolution of a system, and coherent X-ray diffraction imaging (CDI), as a lensless imaging technique, provides a nanoscale resolution, allowing us to clearly observe these microscopic phenomena. This paper presents a new dynamic CDI method based on zone-plate optics aiming to overcome the limitations of existing techniques in imaging fast dynamic processes by integrating the spatio-temporal dual constraint with a probe constraint. In this method, the modulus-enforced probe constraint and the temporal correlation of the dynamic sample low-frequency information are exploited and combined with an empty static region constraint in the dynamic sample. Using this method, we achieved a temporal resolution of 20 Hz and a spatial resolution of 13.2 nm, which were verified by visualized experimental results. Further comparisons showed that the reconstructed images were consistent with the ptychography reconstruction results, confirming the accuracy and feasibility of the method. This work is expected to provide a new tool for materials science and mesoscopic life sciences, promoting a deeper understanding of complex dynamic processes.
- Open Access
- 26 March 2025
- Published by MDPI AG in Nanomaterials
- Vol. 15 (7) , 496
Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography
Scanning transmission X-ray microscopy (STXM) is a direct imaging technique with nanoscale resolution. But its resolution is limited by the spot size on the sample, i.e., by the manufacturing technique of the focusing element. As an emerging high-resolution X-ray imaging technique, ptychography utilizes highly redundant data from overlapping scans as well as phase retrieval algorithms to simultaneously reconstruct a high-resolution sample image and a probe function. In this study, we designed an accurate reconstruction strategy to obtain the probe spot with the vibration effects being eliminated, and developed an image enhancement technique for STXM by combining the reconstructed probe with the deconvolution algorithm. This approach significantly improves the resolution of STXM imaging and can break the limitation of the focal spot on STXM resolution when the scanning step size is near or below the spot size, while the data processing time is much shorter than that of ptychography. Both simulations and experiments show that this approach can be applied to STXM data at different energies and different scan steps using the same focal spot retrieved via ptychography.
- 26 March 2025
- Published by MDPI AG in Nanomaterials
- Vol. 15 (7) , 496
Open AccessEnhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography
Scanning transmission X-ray microscopy (STXM) is a direct imaging technique with nanoscale resolution. But its resolution is limited by the spot size on the sample, i.e., by the manufacturing technique of the focusing element. As an emerging high-resolution X-ray imaging technique, ptychography utilizes highly redundant data from overlapping scans as well as phase retrieval algorithms to simultaneously reconstruct a high-resolution sample image and a probe function. In this study, we designed an accurate reconstruction strategy to obtain the probe spot with the vibration effects being eliminated, and developed an image enhancement technique for STXM by combining the reconstructed probe with the deconvolution algorithm. This approach significantly improves the resolution of STXM imaging and can break the limitation of the focal spot on STXM resolution when the scanning step size is near or below the spot size, while the data processing time is much shorter than that of ptychography. Both simulations and experiments show that this approach can be applied to STXM data at different energies and different scan steps using the same focal spot retrieved via ptychography.
- Open Access
Periodic Artifacts Generation and Suppression in X-ray Ptychography
As a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic artifacts (PAs) in reconstructed images, which is a basic problem in raster-scan ptychography. Herein, we propose a novel periodic-artifact suppressing algorithm (PASA) and present a new understanding of PAs or raster-grid pathology generation mechanisms, which include static intensity (SI) as an important cause of PAs. The PASA employs a gradient descent scheme to iteratively separate the SI pattern from original datasets and a probe support constraint applied in the object update. Both simulative and experimental data reconstructions demonstrated the effectiveness of the new algorithm in suppressing PAs and improving ptychography resolution and indicated a better performance of the PASA method in PA removal compared to other mainstream algorithms. In the meantime, we provided a complete description of SI conception and its key role in PA generation. The present work enhances the feasibility of raster-scan ptychography and could inspire new thoughts for dealing with various noises in ptychography.
Open AccessPeriodic Artifacts Generation and Suppression in X-ray Ptychography
As a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic artifacts (PAs) in reconstructed images, which is a basic problem in raster-scan ptychography. Herein, we propose a novel periodic-artifact suppressing algorithm (PASA) and present a new understanding of PAs or raster-grid pathology generation mechanisms, which include static intensity (SI) as an important cause of PAs. The PASA employs a gradient descent scheme to iteratively separate the SI pattern from original datasets and a probe support constraint applied in the object update. Both simulative and experimental data reconstructions demonstrated the effectiveness of the new algorithm in suppressing PAs and improving ptychography resolution and indicated a better performance of the PASA method in PA removal compared to other mainstream algorithms. In the meantime, we provided a complete description of SI conception and its key role in PA generation. The present work enhances the feasibility of raster-scan ptychography and could inspire new thoughts for dealing with various noises in ptychography.