Danny Wan
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Danny Wan has a total of 101 co-authors. Here are the top co-authors by number of shared publications:
- Clement Godfrin
IMEC, Leuven, Belgium
7 shared publications Stefan Kubicek
Imec 3 , Leuven
5 shared publicationsKristiaan De Greve
Imec 3 , Leuven
4 shared publications- Kristiaan De Greve
IMEC
4 shared publications - Ruoyu Li
IMEC, Leuven, Belgium
4 shared publications - Sofie Beyne
IMEC, Leuven, Belgium
4 shared publications
Latest Publications
- Open Access
- 26 October 2026
- Published by AIP Publishing in Applied Physics Letters
- Vol. 129 (17)
High-fidelity qubit control in a natural Si-MOS quantum dot using a 300 mm silicon on insulator wafer
We demonstrate high-fidelity single qubit control in a natural Si-MOS quantum dot fabricated in an industrial 300 mm wafer process on a silicon on insulator wafer using electron spin resonance. A relatively high optimal Rabi frequency of 5 MHz is achieved, decoupling the electron spin from its 29Si environment. Tracking the qubit frequency reduces the impact of low-frequency noise in the qubit frequency and improves the TRabi from 7 to 11 μs at a Rabi frequency of 5 MHz, resulting in Q-factors exceeding 50. Randomized benchmarking returns an average single gate control fidelity of 99.5±0.3%. As a result of pulse-area calibration, this fidelity is limited by the Rabi Q-factor. These results show that a fast Rabi frequency and a feedback protocol enable high fidelity in these Si-MOS devices, despite the low-frequency magnetic noise.
- 26 October 2026
- Published by AIP Publishing in Applied Physics Letters
- Vol. 129 (17)
Open AccessHigh-fidelity qubit control in a natural Si-MOS quantum dot using a 300 mm silicon on insulator wafer
We demonstrate high-fidelity single qubit control in a natural Si-MOS quantum dot fabricated in an industrial 300 mm wafer process on a silicon on insulator wafer using electron spin resonance. A relatively high optimal Rabi frequency of 5 MHz is achieved, decoupling the electron spin from its 29Si environment. Tracking the qubit frequency reduces the impact of low-frequency noise in the qubit frequency and improves the TRabi from 7 to 11 μs at a Rabi frequency of 5 MHz, resulting in Q-factors exceeding 50. Randomized benchmarking returns an average single gate control fidelity of 99.5±0.3%. As a result of pulse-area calibration, this fidelity is limited by the Rabi Q-factor. These results show that a fast Rabi frequency and a feedback protocol enable high fidelity in these Si-MOS devices, despite the low-frequency magnetic noise.
- 22 June 2026
- Published by AIP Publishing in Applied Physics Letters
- Vol. 128 (25)
Multimode RF reflectometry for spin qubit readout and device characterization
We introduce a multimode superconducting inductor architecture that enables radio frequency reflectometry at multiple discrete frequencies up to 2 GHz, addressing limitations of conventional single-mode designs. The spiral inductor's distributed capacitance yields distinct resonant modes with varied impedance-matching conditions. By probing a quantum dot across several modes, we extract tunneling rates over a broad frequency range and identify signatures of nearby charge defects. Using a higher-order mode of the distributed inductor, rather than the fundamental mode, we demonstrate single-shot spin readout via a radio frequency single-electron transistor (RF-SET), achieving singlet-triplet readout with an integration time of 8 μs and a readout fidelity of 98%. These results establish multimode inductance as a scalable and flexible component for fast spin qubit readout and device-quality characterization.
- 22 June 2026
- Published by AIP Publishing in Applied Physics Letters
- Vol. 128 (25)
Multimode RF reflectometry for spin qubit readout and device characterization
We introduce a multimode superconducting inductor architecture that enables radio frequency reflectometry at multiple discrete frequencies up to 2 GHz, addressing limitations of conventional single-mode designs. The spiral inductor's distributed capacitance yields distinct resonant modes with varied impedance-matching conditions. By probing a quantum dot across several modes, we extract tunneling rates over a broad frequency range and identify signatures of nearby charge defects. Using a higher-order mode of the distributed inductor, rather than the fundamental mode, we demonstrate single-shot spin readout via a radio frequency single-electron transistor (RF-SET), achieving singlet-triplet readout with an integration time of 8 μs and a readout fidelity of 98%. These results establish multimode inductance as a scalable and flexible component for fast spin qubit readout and device-quality characterization.
- 13 May 2026
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (19)
Concatenated continuous driving of silicon qubit by amplitude and phase modulation
- 13 May 2026
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (19)
Concatenated continuous driving of silicon qubit by amplitude and phase modulation
- Open Access
- 4 March 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Quantum Engineering
- Vol. 7, 1-7
Rapid Autotuning of a SiGe Quantum Dot Into the Single-Electron Regime With Machine Learning and RF-Reflectometry FPGA-Based Measurements
Spin qubits need to operate within a very precise voltage space around charge state transitions to achieve high-fidelity gates. However, the stability diagrams that allow the identification of the desired charge states are long to acquire. Moreover, the voltage space to search for the desired charge state increases quickly with the number of qubits. Therefore, faster stability diagram acquisitions are needed to scale up a spin qubit quantum processor. Currently, most methods focus on more efficient data sampling. Our approach shows a significant speedup by combining measurement speedup and a reduction in the number of measurements needed to tune a quantum dot device. Using an autotuning algorithm based on a neural network and faster measurements by harnessing the FPGA embedded in Keysight's Quantum Engineering Toolkit (QET), the measurement time of stability diagrams has been reduced by a factor of 9.8. This led to an acceleration factor of 2.2 for the total initialization time of a SiGe quantum dot into the single-electron regime, which is limited by the Python code execution.
- 4 March 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Quantum Engineering
- Vol. 7, 1-7
Open AccessRapid Autotuning of a SiGe Quantum Dot Into the Single-Electron Regime With Machine Learning and RF-Reflectometry FPGA-Based Measurements
Spin qubits need to operate within a very precise voltage space around charge state transitions to achieve high-fidelity gates. However, the stability diagrams that allow the identification of the desired charge states are long to acquire. Moreover, the voltage space to search for the desired charge state increases quickly with the number of qubits. Therefore, faster stability diagram acquisitions are needed to scale up a spin qubit quantum processor. Currently, most methods focus on more efficient data sampling. Our approach shows a significant speedup by combining measurement speedup and a reduction in the number of measurements needed to tune a quantum dot device. Using an autotuning algorithm based on a neural network and faster measurements by harnessing the FPGA embedded in Keysight's Quantum Engineering Toolkit (QET), the measurement time of stability diagrams has been reduced by a factor of 9.8. This led to an acceleration factor of 2.2 for the total initialization time of a SiGe quantum dot into the single-electron regime, which is limited by the Python code execution.
- 26 January 2026
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (4)
Holes in silicon are heavier than expected: Transport properties of extremely high mobility electrons and holes in silicon MOSFETs
- 26 January 2026
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (4)
Holes in silicon are heavier than expected: Transport properties of extremely high mobility electrons and holes in silicon MOSFETs
- 17 June 2025
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 72 (8) , 4506-4514
Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design
Testing of spin-based quantum devices is currently performed through quantum dot and qubit measurements at deep cryogenic temperatures, well below 1 K. At such low temperatures, the testing throughput is strongly limited due to the long cool-down times and due to the large number of connections required between the device at deep-cryogenic temperature and the room-temperature control electronics. As the number of qubits in a single chip increases and as we advance toward large-scale manufacturing, developing effective techniques that allow to screen those chips at higher temperatures, possibly even room temperature, becomes indispensable. Transistor metrics constitute a promising indicator to identify, at room temperature, which devices are functional and also at cryogenic temperatures. Prior work has demonstrated a strong correlation between quantum dot metrics measured at deep-cryogenic temperature and transistor metrics up to 77 K. To ensure that such a correlation extends up to room temperature, electrostatic confinement of the conductive channel needs to be guaranteed. In this article, we propose a single-electron transistor (SET) design intended for the correlation study of transistor metrics from deep-cryogenic up to room temperatures. Our calibrated technology computer-aided design (TCAD) simulation results demonstrate the drastic improvement of the room-temperature transistor behavior of the proposed design, without the employment of physical device isolation that would negatively impact the qubit’s fidelity. In addition, this work presents a room-temperature-aware methodology in the design phase of spin-based devices, with promising scalability to structures containing a larger number of qubits.
- 17 June 2025
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 72 (8) , 4506-4514
Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design
Testing of spin-based quantum devices is currently performed through quantum dot and qubit measurements at deep cryogenic temperatures, well below 1 K. At such low temperatures, the testing throughput is strongly limited due to the long cool-down times and due to the large number of connections required between the device at deep-cryogenic temperature and the room-temperature control electronics. As the number of qubits in a single chip increases and as we advance toward large-scale manufacturing, developing effective techniques that allow to screen those chips at higher temperatures, possibly even room temperature, becomes indispensable. Transistor metrics constitute a promising indicator to identify, at room temperature, which devices are functional and also at cryogenic temperatures. Prior work has demonstrated a strong correlation between quantum dot metrics measured at deep-cryogenic temperature and transistor metrics up to 77 K. To ensure that such a correlation extends up to room temperature, electrostatic confinement of the conductive channel needs to be guaranteed. In this article, we propose a single-electron transistor (SET) design intended for the correlation study of transistor metrics from deep-cryogenic up to room temperatures. Our calibrated technology computer-aided design (TCAD) simulation results demonstrate the drastic improvement of the room-temperature transistor behavior of the proposed design, without the employment of physical device isolation that would negatively impact the qubit’s fidelity. In addition, this work presents a room-temperature-aware methodology in the design phase of spin-based devices, with promising scalability to structures containing a larger number of qubits.
- 5 March 2025
- Published by American Physical Society (APS) in Physical Review B
- Vol. 111 (12)
Statistical analysis of spurious dot formation in silicon metal-oxide-semiconductor single electron transistors
- 5 March 2025
- Published by American Physical Society (APS) in Physical Review B
- Vol. 111 (12)
Statistical analysis of spurious dot formation in silicon metal-oxide-semiconductor single electron transistors
- 18 September 2024
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 45 (11) , 2217-2220
Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures
Electron-spin qubits are among the most promising platforms for the realization of a large-scale quantum computer. Physical limitations dictate their operation at cryogenic temperatures, in practice often well below 1 K. This requirement implies the employment of a refrigerator featuring long cooldown times and the need for die packaging, thereby strongly limiting the number of devices that can be measured simultaneously. In our work, we evaluate traditional transistor metrics to enable fast wafer-level screening of electron-spin qubit devices above cryogenic temperatures. To the best of our knowledge, a clear link between quantum dot metrics measured below 2 K and traditional transistor metrics measured at higher temperatures has not yet been identified. In this letter, we study the correlation between 10 mK measurements in the few-electron regime, and traditional transistor metrics at different temperatures. We observe a strong correlation up to 77 K, while correlations at higher temperatures are much less pronounced. We analyze this poor correlation via room-temperature TCAD simulations, showing that the underlying physics changes due to a considerable contribution of the substrate current to the device’s off current above 77 K.
- 18 September 2024
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 45 (11) , 2217-2220
Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures
Electron-spin qubits are among the most promising platforms for the realization of a large-scale quantum computer. Physical limitations dictate their operation at cryogenic temperatures, in practice often well below 1 K. This requirement implies the employment of a refrigerator featuring long cooldown times and the need for die packaging, thereby strongly limiting the number of devices that can be measured simultaneously. In our work, we evaluate traditional transistor metrics to enable fast wafer-level screening of electron-spin qubit devices above cryogenic temperatures. To the best of our knowledge, a clear link between quantum dot metrics measured below 2 K and traditional transistor metrics measured at higher temperatures has not yet been identified. In this letter, we study the correlation between 10 mK measurements in the few-electron regime, and traditional transistor metrics at different temperatures. We observe a strong correlation up to 77 K, while correlations at higher temperatures are much less pronounced. We analyze this poor correlation via room-temperature TCAD simulations, showing that the underlying physics changes due to a considerable contribution of the substrate current to the device’s off current above 77 K.
- 13 July 2023
- Published by American Physical Society (APS) in Physical Review B
- Vol. 108 (4) , 045305
Modeling semiconductor spin qubits and their charge noise environment for quantum gate fidelity estimation
The spin of an electron confined in semiconductor quantum dots is currently a promising candidate for quantum bit (qubit) implementations. Taking advantage of the existing CMOS integration technologies, such devices can offer a platform for large scale quantum computation. However, a quantum mechanical framework bridging a device's physical design and operational parameters to the qubit's energy space is lacking. Furthermore, the spin to charge coupling introduced by intrinsic or induced spin-orbit interaction (SOI) exposes the qubits to charge noise compromising their coherence properties and inducing quantum gate errors. We present here a comodeling framework for double quantum dot (DQD) devices and their charge noise environments. We use a combination of an electrostatic potential solver, full configuration interaction quantum mechanical methods, and two-level-fluctuator models to study the quantum gate performance in realistic device designs and operation conditions. We utilize the developed models together alongside the single electron solutions of the quantum dots to simulate one- and two-qubit gates in the presence of charge noise. We find an inverse correlation between quantum gate errors and quantum dot confinement frequencies. We calculate X-gate fidelities in the simulated Si-MOS devices at a typical TLF density of . We also find that exchange driven two-qubit SWAP gates show higher sensitivity to charge noise with fidelities down to in the presence of the same density of TLFs. We further investigate the one- and two-qubit gate fidelities at different TLF densities. We find that given the small size of the quantum dots, sensitivity of a quantum gate to the distance between the noise sources and the quantum dot creates a strong variability in the quantum gate fidelities, which can compromise the device yields in scaled qubit technologies.- 13 July 2023
- Published by American Physical Society (APS) in Physical Review B
- Vol. 108 (4) , 045305
Modeling semiconductor spin qubits and their charge noise environment for quantum gate fidelity estimation
The spin of an electron confined in semiconductor quantum dots is currently a promising candidate for quantum bit (qubit) implementations. Taking advantage of the existing CMOS integration technologies, such devices can offer a platform for large scale quantum computation. However, a quantum mechanical framework bridging a device's physical design and operational parameters to the qubit's energy space is lacking. Furthermore, the spin to charge coupling introduced by intrinsic or induced spin-orbit interaction (SOI) exposes the qubits to charge noise compromising their coherence properties and inducing quantum gate errors. We present here a comodeling framework for double quantum dot (DQD) devices and their charge noise environments. We use a combination of an electrostatic potential solver, full configuration interaction quantum mechanical methods, and two-level-fluctuator models to study the quantum gate performance in realistic device designs and operation conditions. We utilize the developed models together alongside the single electron solutions of the quantum dots to simulate one- and two-qubit gates in the presence of charge noise. We find an inverse correlation between quantum gate errors and quantum dot confinement frequencies. We calculate X-gate fidelities in the simulated Si-MOS devices at a typical TLF density of . We also find that exchange driven two-qubit SWAP gates show higher sensitivity to charge noise with fidelities down to in the presence of the same density of TLFs. We further investigate the one- and two-qubit gate fidelities at different TLF densities. We find that given the small size of the quantum dots, sensitivity of a quantum gate to the distance between the noise sources and the quantum dot creates a strong variability in the quantum gate fidelities, which can compromise the device yields in scaled qubit technologies.- 12 June 2022
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 230-231
Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements
In this work, we report on the electrical performance of an ultra-low-power cryo-CMOS single-pole-4-throw (SP4T) RF multiplexer working at 10 mK base temperature stage of a dilution refrigerator. We use the multiplexer to benchmark a superconducting qubit for the very first time and obtain qubit coherence times of over 35 μs along with an average single-qubit gate fidelity of 99.93%, which exceeds the threshold required for quantum error-correction based on surface-code. This work demonstrates the operability of superconducting qubits with ultra-low-power cryo-CMOS devices at the base temperature, paving the way for advanced co-integration schemes.
- 12 June 2022
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 230-231
Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements
In this work, we report on the electrical performance of an ultra-low-power cryo-CMOS single-pole-4-throw (SP4T) RF multiplexer working at 10 mK base temperature stage of a dilution refrigerator. We use the multiplexer to benchmark a superconducting qubit for the very first time and obtain qubit coherence times of over 35 μs along with an average single-qubit gate fidelity of 99.93%, which exceeds the threshold required for quantum error-correction based on surface-code. This work demonstrates the operability of superconducting qubits with ultra-low-power cryo-CMOS devices at the base temperature, paving the way for advanced co-integration schemes.