DWDanny Wan

Danny Wan

*This is an algorithmically generated author record based on publicly available information.

Current Organizations / Institutes

The organizations/institutes from the scholar's latest article


Danny Wan has a total of 101 co-authors. Here are the top co-authors by number of shared publications:


Latest Publications

  • Open Access

    High-fidelity qubit control in a natural Si-MOS quantum dot using a 300 mm silicon on insulator wafer

    by Xander Peetroons, Xunyao Luo, Tsung-Yeh Yang, Normann Mertig, Sofie Beyne, Julien Jussot, Yosuke Shimura, Clement Godfrin, Bart Raes, Ruoyu Li, et al.

    We demonstrate high-fidelity single qubit control in a natural Si-MOS quantum dot fabricated in an industrial 300 mm wafer process on a silicon on insulator wafer using electron spin resonance. A relatively high optimal Rabi frequency of 5 MHz is achieved, decoupling the electron spin from its 29Si environment. Tracking the qubit frequency reduces the impact of low-frequency noise in the qubit frequency and improves the TRabi from 7 to 11 μs at a Rabi frequency of 5 MHz, resulting in Q-factors exceeding 50. Randomized benchmarking returns an average single gate control fidelity of 99.5±0.3%. As a result of pulse-area calibration, this fidelity is limited by the Rabi Q-factor. These results show that a fast Rabi frequency and a feedback protocol enable high fidelity in these Si-MOS devices, despite the low-frequency magnetic noise.

  • Multimode RF reflectometry for spin qubit readout and device characterization

    by Joffrey Rivard, Alexis Morel, Olivier Romain, El Bachir Ndiaye, Idris Aboubakari, Christian Lupien, Clément Godfrin, Julien Jussot, Stefan Kubicek, Danny Wan, et al.

    We introduce a multimode superconducting inductor architecture that enables radio frequency reflectometry at multiple discrete frequencies up to 2 GHz, addressing limitations of conventional single-mode designs. The spiral inductor's distributed capacitance yields distinct resonant modes with varied impedance-matching conditions. By probing a quantum dot across several modes, we extract tunneling rates over a broad frequency range and identify signatures of nearby charge defects. Using a higher-order mode of the distributed inductor, rather than the fundamental mode, we demonstrate single-shot spin readout via a radio frequency single-electron transistor (RF-SET), achieving singlet-triplet readout with an integration time of 8 μs and a readout fidelity of 98%. These results establish multimode inductance as a scalable and flexible component for fast spin qubit readout and device-quality characterization.

  • Concatenated continuous driving of silicon qubit by amplitude and phase modulation

    by Takuma Kuno, Takeru Utsugi, Andrew J. Ramsay, Normann Mertig, Noriyuki Lee, Itaru Yanagi, Toshiyuki Mine, Nobuhiro Kusuno, Hideo Arimoto, Sofie Beyne, et al.


  • Open Access

    Rapid Autotuning of a SiGe Quantum Dot Into the Single-Electron Regime With Machine Learning and RF-Reflectometry FPGA-Based Measurements

    by Marc-Antoine Roux, Joffrey Rivard, Victor Yon, Alexis Morel, Dominic Leclerc, Claude Rohrbacher, El Bachir Ndiaye, Felice Francesco Tafuri, Brendan Bono, Stefan Kubicek, et al.

    Spin qubits need to operate within a very precise voltage space around charge state transitions to achieve high-fidelity gates. However, the stability diagrams that allow the identification of the desired charge states are long to acquire. Moreover, the voltage space to search for the desired charge state increases quickly with the number of qubits. Therefore, faster stability diagram acquisitions are needed to scale up a spin qubit quantum processor. Currently, most methods focus on more efficient data sampling. Our approach shows a significant speedup by combining measurement speedup and a reduction in the number of measurements needed to tune a quantum dot device. Using an autotuning algorithm based on a neural network and faster measurements by harnessing the FPGA embedded in Keysight's Quantum Engineering Toolkit (QET), the measurement time of stability diagrams has been reduced by a factor of 9.8. This led to an acceleration factor of 2.2 for the total initialization time of a SiGe quantum dot into the single-electron regime, which is limited by the Python code execution.


  • Holes in silicon are heavier than expected: Transport properties of extremely high mobility electrons and holes in silicon MOSFETs

    by J. P. Wendoloski, J. Hillier, S. D. Liles, M. J. Rendell, Y. Ashlea-Alava, B. Raes, R. Li, S. Kubicek, C. Godfrin, J. Jussot, et al.


  • Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design

    by Francesco Lorenzelli, Kuan-Chu Chen, Clement Godfrin, Michele Stucchi, Alexander Grill, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges Gielen

    Testing of spin-based quantum devices is currently performed through quantum dot and qubit measurements at deep cryogenic temperatures, well below 1 K. At such low temperatures, the testing throughput is strongly limited due to the long cool-down times and due to the large number of connections required between the device at deep-cryogenic temperature and the room-temperature control electronics. As the number of qubits in a single chip increases and as we advance toward large-scale manufacturing, developing effective techniques that allow to screen those chips at higher temperatures, possibly even room temperature, becomes indispensable. Transistor metrics constitute a promising indicator to identify, at room temperature, which devices are functional and also at cryogenic temperatures. Prior work has demonstrated a strong correlation between quantum dot metrics measured at deep-cryogenic temperature and transistor metrics up to 77 K. To ensure that such a correlation extends up to room temperature, electrostatic confinement of the conductive channel needs to be guaranteed. In this article, we propose a single-electron transistor (SET) design intended for the correlation study of transistor metrics from deep-cryogenic up to room temperatures. Our calibrated technology computer-aided design (TCAD) simulation results demonstrate the drastic improvement of the room-temperature transistor behavior of the proposed design, without the employment of physical device isolation that would negatively impact the qubit’s fidelity. In addition, this work presents a room-temperature-aware methodology in the design phase of spin-based devices, with promising scalability to structures containing a larger number of qubits.


  • Statistical analysis of spurious dot formation in silicon metal-oxide-semiconductor single electron transistors

    by Kuan-Chu Chen, Clement Godfrin, George Simion, Imri Fattal, Julien Jussot, Stefan Kubicek, Sofie Beyne, Bart Raes, Arne Loenders, Kuo-Hsing Kao, et al.


  • Understanding the Transistor Behavior of Electron-Spin Qubits Above Cryogenic Temperatures

    by Francesco Lorenzelli, Clement Godfrin, Michele Stucchi, Alexander Grill, Ruoyu Li, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges Gielen

    Electron-spin qubits are among the most promising platforms for the realization of a large-scale quantum computer. Physical limitations dictate their operation at cryogenic temperatures, in practice often well below 1 K. This requirement implies the employment of a refrigerator featuring long cooldown times and the need for die packaging, thereby strongly limiting the number of devices that can be measured simultaneously. In our work, we evaluate traditional transistor metrics to enable fast wafer-level screening of electron-spin qubit devices above cryogenic temperatures. To the best of our knowledge, a clear link between quantum dot metrics measured below 2 K and traditional transistor metrics measured at higher temperatures has not yet been identified. In this letter, we study the correlation between 10 mK measurements in the few-electron regime, and traditional transistor metrics at different temperatures. We observe a strong correlation up to 77 K, while correlations at higher temperatures are much less pronounced. We analyze this poor correlation via room-temperature TCAD simulations, showing that the underlying physics changes due to a considerable contribution of the substrate current to the device’s off current above 77 K.


  • Modeling semiconductor spin qubits and their charge noise environment for quantum gate fidelity estimation

    by M. Mohamed El Kordy Shehata, George Simion, Ruoyu Li, Fahd A. Mohiyaddin, Danny Wan, Massimo Mongillo, Bogdan Govoreanu, Iuliana Radu, Kristiaan De Greve, Pol Van Dorpe

    The spin of an electron confined in semiconductor quantum dots is currently a promising candidate for quantum bit (qubit) implementations. Taking advantage of the existing CMOS integration technologies, such devices can offer a platform for large scale quantum computation. However, a quantum mechanical framework bridging a device's physical design and operational parameters to the qubit's energy space is lacking. Furthermore, the spin to charge coupling introduced by intrinsic or induced spin-orbit interaction (SOI) exposes the qubits to charge noise compromising their coherence properties and inducing quantum gate errors. We present here a comodeling framework for double quantum dot (DQD) devices and their charge noise environments. We use a combination of an electrostatic potential solver, full configuration interaction quantum mechanical methods, and two-level-fluctuator models to study the quantum gate performance in realistic device designs and operation conditions. We utilize the developed models together alongside the single electron solutions of the quantum dots to simulate one- and two-qubit gates in the presence of charge noise. We find an inverse correlation between quantum gate errors and quantum dot confinement frequencies. We calculate X-gate fidelities >97% in the simulated Si-MOS devices at a typical TLF density of 1011cm−2. We also find that exchange driven two-qubit SWAP gates show higher sensitivity to charge noise with fidelities down to 91% in the presence of the same density of TLFs. We further investigate the one- and two-qubit gate fidelities at different TLF densities. We find that given the small size of the quantum dots, sensitivity of a quantum gate to the distance between the noise sources and the quantum dot creates a strong variability in the quantum gate fidelities, which can compromise the device yields in scaled qubit technologies.


  • Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements

    by Rohith Acharya, Anton Potocnik, Steven Brebels, Alexander Grill, Jeroen Verjauw, Tsvetan Ivanov, Daniel Perez Lozano, Danny Wan, Fahd A. Mohiyaddin, Jacques Van Damme, et al.

    In this work, we report on the electrical performance of an ultra-low-power cryo-CMOS single-pole-4-throw (SP4T) RF multiplexer working at 10 mK base temperature stage of a dilution refrigerator. We use the multiplexer to benchmark a superconducting qubit for the very first time and obtain qubit coherence times of over 35 μs along with an average single-qubit gate fidelity of 99.93%, which exceeds the threshold required for quantum error-correction based on surface-code. This work demonstrates the operability of superconducting qubits with ultra-low-power cryo-CMOS devices at the base temperature, paving the way for advanced co-integration schemes.