Joo-Hyung Chae
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Previous Organizations / Institutes
The organizations / institutes from the scholar's other articles in the past ten years
Research Subjects
Joo-Hyung Chae has a total of 110 co-authors. Here are the top co-authors by number of shared publications:
- Suhwan Kim
Department of Electrical and Computer Engineering and the Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea
22 shared publications - Yong-Un Jeong
Department of Semiconductor Systems Engineering, Sejong University, Seoul, South Korea
13 shared publications Jihwan Park
Department of DRAM Design, SK Hynix, Icheon, South Korea
11 shared publicationsMino Kim
Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea
8 shared publicationsSuhwan Kim
Dept. of Eletrical and Computer Engineering, Seoul National University, Seoul, Korea
8 shared publicationsJaekwang Yun
Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea
7 shared publications
Latest Publications
- 1 November 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems I: Regular Papers
- Vol. 73 (11) , 7331-7342
0.193 pJ/bit and 0.02 pJ/bit/dB Reference-Voltage-Less Die-to-Die Interface With State-Dependent Differentiator-TIA-Integrated RX
- 1 November 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems I: Regular Papers
- Vol. 73 (11) , 7331-7342
0.193 pJ/bit and 0.02 pJ/bit/dB Reference-Voltage-Less Die-to-Die Interface With State-Dependent Differentiator-TIA-Integrated RX
- Open Access
- 6 September 2026
- Published by Wiley in Advanced Science
- p. e77554
Probabilistic Computing via Gate‐Tunable Random Telegraph Noise
Although probabilistic computing offers a route to quantum‐inspired optimization at room temperature, existing probabilistic bits (p‐bits) often depend on non‐CMOS devices or circuit‐intensive randomness. Here, we report a CMOS‐compatible p‐bit that harnesses intrinsic random telegraph noise (RTN) in a fully depleted silicon‐on‐insulator field‐effect transistor to produce stochastic binary outputs with direct gate‐voltage control. The capture and emission dynamics follow Shockley–Read–Hall (SRH) kinetics, yielding a quantitative sigmoid bias‐to‐probability transfer, and the dwell‐time statistics exhibit Poisson behavior consistent with memoryless switching. Pairwise statistical independence between independently measured RTN streams is supported through probabilistic Boolean operations and cross‐correlation analysis. Using the experimentally derived RTN probability response, we perform an RTN‐derived numerical emulation of simulated annealing for the two‐dimensional hydrophobic–polar protein‐folding benchmark, reaching low‐energy configurations with fewer stochastic update iterations than the number of candidate conformations evaluated by exhaustive enumeration. We further map the same update pipeline into a digital logic design using integer energy evaluation and lookup‐table probability mapping, providing a practical pathway toward CMOS‐based probabilistic accelerators. Collectively, these results elevate intrinsic transistor noise from an unwanted artifact to a gate‐tunable, CMOS‐compatible stochastic primitive, providing a physically grounded pathway toward CMOS‐based probabilistic processors.
- 6 September 2026
- Published by Wiley in Advanced Science
- p. e77554
Open AccessProbabilistic Computing via Gate‐Tunable Random Telegraph Noise
Although probabilistic computing offers a route to quantum‐inspired optimization at room temperature, existing probabilistic bits (p‐bits) often depend on non‐CMOS devices or circuit‐intensive randomness. Here, we report a CMOS‐compatible p‐bit that harnesses intrinsic random telegraph noise (RTN) in a fully depleted silicon‐on‐insulator field‐effect transistor to produce stochastic binary outputs with direct gate‐voltage control. The capture and emission dynamics follow Shockley–Read–Hall (SRH) kinetics, yielding a quantitative sigmoid bias‐to‐probability transfer, and the dwell‐time statistics exhibit Poisson behavior consistent with memoryless switching. Pairwise statistical independence between independently measured RTN streams is supported through probabilistic Boolean operations and cross‐correlation analysis. Using the experimentally derived RTN probability response, we perform an RTN‐derived numerical emulation of simulated annealing for the two‐dimensional hydrophobic–polar protein‐folding benchmark, reaching low‐energy configurations with fewer stochastic update iterations than the number of candidate conformations evaluated by exhaustive enumeration. We further map the same update pipeline into a digital logic design using integer energy evaluation and lookup‐table probability mapping, providing a practical pathway toward CMOS‐based probabilistic accelerators. Collectively, these results elevate intrinsic transistor noise from an unwanted artifact to a gate‐tunable, CMOS‐compatible stochastic primitive, providing a physically grounded pathway toward CMOS‐based probabilistic processors.
- 1 September 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Express Briefs
- Vol. 73 (9) , 933-937
A 1.54-dB⋅pJ/bit Supply-Noise Tolerant Bias-Free Capacitively Driven Slope-Sampling Transceiver With FIR-Based Crosstalk Cancellation
- 1 September 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Express Briefs
- Vol. 73 (9) , 933-937
A 1.54-dB⋅pJ/bit Supply-Noise Tolerant Bias-Free Capacitively Driven Slope-Sampling Transceiver With FIR-Based Crosstalk Cancellation
- 8 May 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Express Briefs
- Vol. 73 (6) , 623-627
A 0.067-pJ/bit/dB Transmitter for Low-Power Memory Interfaces With Charge-Pump-Aided On-Demand Sub-Pre-Emphasis for Worst-Case Pattern Compensation
A single-ended transmitter (TX) employing a charge-pump-aided main and sub pre-emphasis feed-forward equalizer (FFE) for low-power memory interfaces is presented. By overcoming the voltage headroom limitation of VSS termination, the proposed scheme increases the voltage swing while compensating for channel loss. To mitigate FFE degradation at high data rates and under severe channel loss, an additional on-demand sub pull-up FFE driver and sub pull-down charge pump are introduced. These selectively enhance equalization during bit-toggling patterns and at transitions after consecutive identical digits, improving signal integrity compared with conventional designs. Fabricated in a 28-nm CMOS process, the TX occupies an active area of 0.0065 mm2 and achieves 18-Gb/s single-ended signal transmission over a channel with a –15.7 dB loss. The measured power consumption is 18.85 mW, corresponding to 1.05 pJ/bit and a figure of merit of 0.067 pJ/bit/dB.
- 8 May 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Express Briefs
- Vol. 73 (6) , 623-627
A 0.067-pJ/bit/dB Transmitter for Low-Power Memory Interfaces With Charge-Pump-Aided On-Demand Sub-Pre-Emphasis for Worst-Case Pattern Compensation
A single-ended transmitter (TX) employing a charge-pump-aided main and sub pre-emphasis feed-forward equalizer (FFE) for low-power memory interfaces is presented. By overcoming the voltage headroom limitation of VSS termination, the proposed scheme increases the voltage swing while compensating for channel loss. To mitigate FFE degradation at high data rates and under severe channel loss, an additional on-demand sub pull-up FFE driver and sub pull-down charge pump are introduced. These selectively enhance equalization during bit-toggling patterns and at transitions after consecutive identical digits, improving signal integrity compared with conventional designs. Fabricated in a 28-nm CMOS process, the TX occupies an active area of 0.0065 mm2 and achieves 18-Gb/s single-ended signal transmission over a channel with a –15.7 dB loss. The measured power consumption is 18.85 mW, corresponding to 1.05 pJ/bit and a figure of merit of 0.067 pJ/bit/dB.
- 29 April 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Consumer Electronics
- Vol. PP (00983063) , 1
An Ultra-Flat Cryogenic CMOS LNA with Pole-Aligning Technique and Robustness Against Conductivity Variation for Quantum Computing
This paper presents a 28-nm CMOS low-noise amplifier (LNA) designed for cryogenic quantum computing systems. The proposed three-stage common-source LNA employs a pole-aligning technique to achieve an ultra-flat and wideband gain, while maintaining robustness against temperature-dependent metal conductivity variation thanks to removing ground planes beneath the inductors. Measurement results at 4 K demonstrate a 30.4 dB gain, 6.1 GHz 1-dB bandwidth (4.2 GHz - 10.3 GHz), 0.36 dB average noise figure, and 4.8 mW power consumption, showing excellent stability and bandwidth performance compared with prior cryogenic LNAs.
- 29 April 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Consumer Electronics
- Vol. PP (00983063) , 1
An Ultra-Flat Cryogenic CMOS LNA with Pole-Aligning Technique and Robustness Against Conductivity Variation for Quantum Computing
This paper presents a 28-nm CMOS low-noise amplifier (LNA) designed for cryogenic quantum computing systems. The proposed three-stage common-source LNA employs a pole-aligning technique to achieve an ultra-flat and wideband gain, while maintaining robustness against temperature-dependent metal conductivity variation thanks to removing ground planes beneath the inductors. Measurement results at 4 K demonstrate a 30.4 dB gain, 6.1 GHz 1-dB bandwidth (4.2 GHz - 10.3 GHz), 0.36 dB average noise figure, and 4.8 mW power consumption, showing excellent stability and bandwidth performance compared with prior cryogenic LNAs.
- 1 January 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems I: Regular Papers
- p. 1-14
A 62.5-fJ/b/mm and 23.6-fJ/b/dB Transition-Detection-Based Transceiver Robust to Higher Order ISI and Low-Frequency Supply Noise for On-Chip Global Data Bus and HBM Interfaces
- 1 January 2026
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems I: Regular Papers
- p. 1-14
A 62.5-fJ/b/mm and 23.6-fJ/b/dB Transition-Detection-Based Transceiver Robust to Higher Order ISI and Low-Frequency Supply Noise for On-Chip Global Data Bus and HBM Interfaces