Norbert Herfurth

There is an imminent trade-off between an Integrated Circuit (IC)’s testability and its physical security. While Design for Test (DfT) techniques, such as scan chains make the circuit’s physical behavior at runtime observable and easy to control, these techniques form a lucrative class of attack vectors with the potential to compromise the entire security architecture of the Device under Test (DuT). Moreover, with the rapid development of more complex technologies, the need for integration of DfT techniques even intensifies due to the requirement for faster time-to-market of cutting-edge ICs. In this work, we demonstrate that sensitive data can be extracted from the registers once their locations on the chip are identified by exploiting DfT structures and optically probing them — in this case, scan chains, even after the access to test mode is restricted. Furthermore, we show that also an obfuscated scan chain architecture can be fully reconstructed by using tools and techniques encountered in the Failure Analysis (FA) domain.

This article presents and evaluates a calibration method that significantly improves the spectral information that can be extracted from photon emission signals obtained from semiconductor devices. Step-by-step instructions are given for calibrating photon emission microscopes for specific measurements such as device parameters and material band gap. The article also discusses the types of errors that can occur during calibration. Although the procedure presented is used on InGaAs sensors, it applies to all common photon emission detectors.

This paper reviews the evolution of a powerful class of physical attacks against integrated circuits (ICs), developed initially for performing failure analysis (FA) from the IC backside. Over the last two decades, several publications have demonstrated the effectiveness of these techniques in bypassing the IC protection schemes and extracting the stored assets inside secure ICs. In this work, we take a fresh look at such hardware attacks from three different perspectives. First, we will discuss the potential threat of the attacks against modern technologies and demystify a set of wrong beliefs about the attacks' complexity. Second, we review some technical challenges of such attacks from a law enforcement agency's perspective for unraveling crimes and preventing further crimes by criminals involved. Finally, we give an insight into the future development of FA tools and the opportunities for designing effective countermeasures against attacks through the chip backside.