Loss Evaluation of Microstrip Line Using Low-Loss Olefin-Based Resin Build-Up Film in 160-GHz Band
- 19 February 2025
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 73 (9) , 5897-5908
Abstract
A new film material, MW300, that is both compatible with build-up processes and capable of maintaining low dielectric loss, has been developed. Measurements of the dielectric properties of MW300 in the subterahertz band exhibited a loss tangent, tan δ of 0.0022 at 160 GHz, demonstrating lower loss compared to conventional build-up compatible organic materials. Analysis of the transmission loss in microstrip lines (MSLs) indicated that dielectric loss is more dominant than conductor loss in the subterahertz region, suggesting that using low-dielectric-loss materials is effective in reducing transmission loss. MSLs were fabricated on build-up substrates using both conventional materials and MW300. Measurements of the transmission loss confirmed the analytical predictions. The MSL using MW300 achieved a low-loss measurement result of 0.10 dB/mm in the 160-GHz band.Keywords
This publication has 39 references indexed in Scilit:
- Development of newly low-dielectric organic substrate material for a millimeter-wave radar2021
- Antennas in Glass Interposer For sub-THz Applications2021
- Characterization of Interconnects on Multilayer High Frequency PCB for D- Band2020
- Characterization of PCB s-parameters with a new calibration method2016
- D-Band characterization of co-planar wave guide and microstrip transmission lines on liquid crystal polymer2013
- Microwave Characterization of Copper-Clad Dielectric Laminate SubstratesIEICE Transactions on Electronics, 2007
- Microwave Engineering2007
- Complex Relative Permittivity Measurement in the Frequency Range of 30-110 GHz by Fabry-Perot Resonator Method2001
- Foundations for Microwave Engineering2001
- The accurate measurement of permittivity by means of an open resonatorProceedings of the Royal Society of London. A. Mathematical and Physical Sciences, 1971